Eclipse.org Eclipse.org testcount Device Kit

XML Element 

<testcount> element

Device Kit Attributes Elements XML Reference
Specifies the number of times to execute the test cases.

Content type: unsignedInt

Examples: testcount examples


Sibling NameSibling Description
Element <testcount> element siblings
<description>Description of the adapter test.
<history>New Specifies the adapter test history.
<deprecated>Specifies that the contents of this element should be marked as deprecated.
<provider>Specifies the provider.
<version>Specifies the current version level. The format of the version number should be n.n.n where n is a number. For example, 1.0.0 is a valid version.
<vendor>Specifies an implementing vendor.
<incubation>If the contents of this element is true, then this is an incubation project.
<spec>Hardware specification documentation for this adapter.
<multiplex>New Specifies that this is a multiplex adapter test.
<customparameter>New Specifies a custom parameter for this adapter test.
<send>Specifies the message(s) to send during the test.
<adapter>Specifies the adapter to be tested.
<testdelay>Specifies the milliseconds to sleep between each test.
<junit>Specifies a junit test. Currently, not supported.
<monitor>Specifies a monitor test. Currently, not supported.
<playback>Specifies a playback test. Currently, not supported.
<swt>Specifies a Standard Widget Toolkit (SWT) user interface adapter test.
<testcase>Specifies a junit testcase.
<bundle>Specifies an Open Services Gateway Initiative (OSGi) bundle should be created.
<managedbundle>Specifies an Open Services Gateway Initiative (OSGi) managed bundle should be created.
<managedfactorybundle>Specifies an Open Services Gateway Initiative (OSGi) managed factory bundle should be created.

Element NameElement Description
Element <testcount> element tree
<dkml>Specifies the root element of a Device Kit &lt;b&gt;D&lt;/b&gt;evice &lt;b&gt;K&lt;/b&gt;it &lt;b&gt;L&lt;/b&gt;anguage (dkml) document.
¦-<adaptertest>Specifies an adapter test.
¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.
¦-<agenttest>Specifies an agent test.
¦ ¦-<agentmodeltest>Specifies the agent model test.
¦ ¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.(see testcount)
¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.(see testcount)
¦-<agentmodeltest>Specifies an agent model test.(see agentmodeltest)
¦-<concretetest>Specifies a concrete test.
¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.(see testcount)
¦-<connectiontest>Specifies an connection test.
¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.(see testcount)
¦-<devicetest>Specifies a device test.
¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.(see testcount)
¦-<profiletest>Specifies a profile test.
¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.(see testcount)
¦-<receivertest>Specifies a receiver transport test.
¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.(see testcount)
¦-<transporttest>Specifies a transport test.
¦ ¦-<testcount>Unsigned integer that specifies the number of times to execute tests.(see testcount)

Copyright (c) 2009 IBM. See license in Legal section. 2009-01-22 Device Kit XML Reference 1.2.0